• DocumentCode
    2167196
  • Title

    Performance evaluation of bulk Si and SOI RF LDMOSFETs for emerging RFIC applications

  • Author

    Perupalli, P. ; Trivedi, M. ; Shenai, K. ; Leong, S.K.

  • Author_Institution
    Illinois Univ., Chicago, IL, USA
  • fYear
    1997
  • fDate
    6-9 Oct 1997
  • Firstpage
    108
  • Lastpage
    109
  • Abstract
    This paper presents the evaluation of performance of 50 V LDMOSFETS designed in bulk Si and SOI for use in power amplifiers for cellular base stations. SOI technology has been fast emerging as the major technology for RF applications due to its inherent advantages such as lower parasitics, lower on-resistance and better noise immunity. Extensive 2-D simulations on an advanced process and device simulator have been performed to study the carrier dynamics in the LDMOSFET. This allows for a better understanding of the means to reduce the device parasitics, that are a major factor limiting the RF performance of the transistor. A simple circuit model has been developed for the LDMOSFET for use in performing large signal AC analyses for RF characterization. Non-Isothermal simulations on the SOI device have shown that at the feature dimensions under consideration, the self heating does not affect the DC and RF performance significantly
  • Keywords
    power MOSFET; semiconductor device models; silicon-on-insulator; 2D simulation; 50 V; DC performance; RF performance; RFIC application; SOI RF LDMOSFET; Si; bulk Si RF LDMOSFET; carrier dynamics; cellular base station; circuit model; device parasitics; large signal AC analysis; noise immunity; nonisothermal simulation; on-resistance; power amplifier; self heating; Base stations; Circuit simulation; Heating; Performance analysis; Power amplifiers; RF signals; Radio frequency; Radiofrequency amplifiers; Signal analysis; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1997. Proceedings., 1997 IEEE International
  • Conference_Location
    Fish Camp, CA
  • ISSN
    1078-621X
  • Print_ISBN
    0-7803-3938-X
  • Type

    conf

  • DOI
    10.1109/SOI.1997.634956
  • Filename
    634956