DocumentCode :
2167275
Title :
A high performance active pixel sensor with 0.18um CMOS color imager technology
Author :
Shou-Gwo Wuu ; Ho-Ching Chien ; Dun-Nian Yaung ; Chien-Hsien Tseng ; Wang, C.S. ; Chin-Kung Chang ; Yu-Kung Hsaio
Author_Institution :
Taiwan Semicond. Manuf. Co., Hsin-Chu, Taiwan
fYear :
2001
fDate :
2-5 Dec. 2001
Abstract :
A high performance 0.18 um CMOS image sensor technology has been successfully developed and fully characterized. 3T active pixel sensor (APS) with non-silicide source/drain process is provided to reduce dark current and increase photoresponse. By optimizing photodiode junction profile with the appropriate thermal cycle, the dark current can be drastically reduced. Small pixel pitch 2.8um/spl sim/4.0um demonstrates the low dark current (less 0.2 fA/pixel), the excellent sensitivity and dynamic range. Especially, the superior standard deviation of dark signal 8.3 mV/sec, will offer a low white pixel technology. The color pixel performance with microlens is also reported in this paper.
Keywords :
CMOS image sensors; photodiodes; 0.18 micron; CMOS color imager technology; active pixel sensor; color pixel technology; dark current; dynamic range; microlens; nonsilicide source/drain process; photodiode junction profile; photoresponse; sensitivity; thermal cycling; white pixel technology; CMOS image sensors; CMOS technology; Color; Computational Intelligence Society; Dark current; Filters; Lenses; Microoptics; Pixel; Sensor phenomena and characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
Type :
conf
DOI :
10.1109/IEDM.2001.979567
Filename :
979567
Link To Document :
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