• DocumentCode
    2167275
  • Title

    A high performance active pixel sensor with 0.18um CMOS color imager technology

  • Author

    Shou-Gwo Wuu ; Ho-Ching Chien ; Dun-Nian Yaung ; Chien-Hsien Tseng ; Wang, C.S. ; Chin-Kung Chang ; Yu-Kung Hsaio

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Hsin-Chu, Taiwan
  • fYear
    2001
  • fDate
    2-5 Dec. 2001
  • Abstract
    A high performance 0.18 um CMOS image sensor technology has been successfully developed and fully characterized. 3T active pixel sensor (APS) with non-silicide source/drain process is provided to reduce dark current and increase photoresponse. By optimizing photodiode junction profile with the appropriate thermal cycle, the dark current can be drastically reduced. Small pixel pitch 2.8um/spl sim/4.0um demonstrates the low dark current (less 0.2 fA/pixel), the excellent sensitivity and dynamic range. Especially, the superior standard deviation of dark signal 8.3 mV/sec, will offer a low white pixel technology. The color pixel performance with microlens is also reported in this paper.
  • Keywords
    CMOS image sensors; photodiodes; 0.18 micron; CMOS color imager technology; active pixel sensor; color pixel technology; dark current; dynamic range; microlens; nonsilicide source/drain process; photodiode junction profile; photoresponse; sensitivity; thermal cycling; white pixel technology; CMOS image sensors; CMOS technology; Color; Computational Intelligence Society; Dark current; Filters; Lenses; Microoptics; Pixel; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-7050-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2001.979567
  • Filename
    979567