Title :
Directed Random SBST Generation for On-Line Testing of Pipelined Processors
Author :
Merentitis, A. ; Theodorou, G. ; Giorgaras, M. ; Kranitis, N.
Author_Institution :
Dept. of Inf. & Telecommun., Univ. of Athens, Athens
Abstract :
Software-based self-test (SBST) has emerged as an effective strategy for non-concurrent on-line testing of processors integrated in embedded system applications. It offers the potential for on-line testing without any hardware overhead. However, test generation is usually based in a semi-automated approach and gate-level information is required for effective test program generation.In this paper we present a methodology for converting processor validation tests in order to perform automated directed random SBST routine generation, based on templates that are developed utilizing a combination of functional and high-level structural pattern generation approaches. The methodology is applied on the OpenRISC 1200 processor, easily achieving test coverage of 86.43%, using only low-effort gate-level independent code generation.
Keywords :
automatic test pattern generation; logic testing; microprocessor chips; pipeline processing; OpenRISC 1200 processor; SBST generation; gate-level independent code generation; high-level structural pattern generation approaches; on-line testing; pipelined processors; processor validation; software-based self-test generation; Application software; Automatic test pattern generation; Automatic testing; Built-in self-test; Embedded system; Hardware; Performance evaluation; Software testing; System testing; Test pattern generators; automation; directed; on-line; processor testing; random; software-based self-test;
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
DOI :
10.1109/IOLTS.2008.18