Title :
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection
Author :
Pouget, V. ; Douin, A. ; Foucard, G. ; Peronnard, P. ; Lewis, D. ; Fouillat, P. ; Velazco, R.
Author_Institution :
IMS, Bordeaux Univ., Talence
Abstract :
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
Keywords :
SRAM chips; dynamic testing; field programmable gate arrays; logic testing; synchronisation; DES crypto-core; SRAM-based FPGA; Xilinx Virtex II; dynamic testing; pulsed laser; synchronization; time-resolved fault injection; Circuit faults; Circuit testing; Cryptography; Electronic equipment testing; Field programmable gate arrays; Laser modes; Optical pulses; Photoconductivity; Timing; Vehicle dynamics; FPGA; dynamic testing; fault injection; pulsed laser;
Conference_Titel :
On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International
Conference_Location :
Rhodes
Print_ISBN :
978-0-7695-3264-6
DOI :
10.1109/IOLTS.2008.39
