DocumentCode
2167454
Title
Study of reliability and process ability for preset underfill sheet material as future standard flip chip packaging process
Author
Noro, Hiroshi ; Mizutani, Masaki ; Kuwamura, Makoto ; Usui, Hideyuki ; Ito, Satoshi
Author_Institution
Nitto Denko Corp., Mie, Japan
fYear
2000
fDate
2000
Firstpage
319
Lastpage
322
Abstract
Process technology in flip chip assembly is an important factor in considering the package reliability, cost reduction and stability of mass production. A novel flip chip packaging technology using non-conductive underfill resin sheet was developed. This new technology is no-flux flip chip packaging technology which eliminates the flux applying and cleaning process in current liquid underfill resin with dispensing system. It has a lot of potential to make the packaging process simpler and reduce handling difficulty compared with liquid underfill dispensing process. Additionally, it makes moisture related reliability performance higher because this underfill resin sheet introduces an epoxy resin with phenol curing system. In this paper, we studied the process ability and reliability on two kinds of packaging processes with non-conductive underfill resin sheets. The higher stress reliability and productivity was shown with the proper underfill resin component and packaging process
Keywords
encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit reliability; flip-chip packaging; mass production; no-flux process technology; nonconductive epoxy resin; phenol curing system; reliability; underfill sheet material; Assembly; Cleaning; Costs; Curing; Epoxy resins; Flip chip; Mass production; Moisture; Packaging; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-5908-9
Type
conf
DOI
10.1109/ECTC.2000.853170
Filename
853170
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