• DocumentCode
    2167476
  • Title

    Studies on a reflowable underfill for flip chip application

  • Author

    Wang, Tie ; Lum, Colin ; Kee, Joanne ; Chew, T.H. ; Miao, Ping ; Foo, Louis ; Lin, Charles

  • Author_Institution
    Questech Solution Pte Ltd., Singapore
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    323
  • Lastpage
    329
  • Abstract
    This paper presents the material properties, assembly process identification and reliability performance coupled with failure analysis of a newly developed reflowable underfill. The curing profile, glass transition temperature (Tg), coefficient of thermal expansion (CTE) and modules were investigated via differential scanning calorimeter (DSC), thermo-mechanical analyzer (TMA) and dynamic mechanical analyzer (DMA), respectively. The dependence of viscosity on aging time was measured via Brookfield viscometer. Wettability was demonstrated through solder sphere wetting test. In addition, the effect of reflow profile on wettability was evaluated as well, for example, the variation of overall acid number under several reflow profiles was monitored via titration with standard sodium hydroxide (NaOH) solution. After that, approaches to control voids were made by manipulating material aging time and adjusting reflow profile, and the effects were subsequently identified via scanning acoustic microscopy (C-SAM)
  • Keywords
    encapsulation; flip-chip devices; Brookfield viscometry; acid number; aging; coefficient of thermal expansion; curing profile; differential scanning calorimetry; dynamic mechanical analysis; elastic modulus; failure analysis; flip-chip packaging; glass transition temperature; reflowable underfill material; reliability; scanning acoustic microscopy; solder sphere wetting test; thermomechanical analysis; titration; viscosity; void; wettability; Aging; Assembly; Curing; Failure analysis; Flip chip; Glass; Material properties; Materials reliability; Temperature; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853171
  • Filename
    853171