Title :
Studies on a reflowable underfill for flip chip application
Author :
Wang, Tie ; Lum, Colin ; Kee, Joanne ; Chew, T.H. ; Miao, Ping ; Foo, Louis ; Lin, Charles
Author_Institution :
Questech Solution Pte Ltd., Singapore
Abstract :
This paper presents the material properties, assembly process identification and reliability performance coupled with failure analysis of a newly developed reflowable underfill. The curing profile, glass transition temperature (Tg), coefficient of thermal expansion (CTE) and modules were investigated via differential scanning calorimeter (DSC), thermo-mechanical analyzer (TMA) and dynamic mechanical analyzer (DMA), respectively. The dependence of viscosity on aging time was measured via Brookfield viscometer. Wettability was demonstrated through solder sphere wetting test. In addition, the effect of reflow profile on wettability was evaluated as well, for example, the variation of overall acid number under several reflow profiles was monitored via titration with standard sodium hydroxide (NaOH) solution. After that, approaches to control voids were made by manipulating material aging time and adjusting reflow profile, and the effects were subsequently identified via scanning acoustic microscopy (C-SAM)
Keywords :
encapsulation; flip-chip devices; Brookfield viscometry; acid number; aging; coefficient of thermal expansion; curing profile; differential scanning calorimetry; dynamic mechanical analysis; elastic modulus; failure analysis; flip-chip packaging; glass transition temperature; reflowable underfill material; reliability; scanning acoustic microscopy; solder sphere wetting test; thermomechanical analysis; titration; viscosity; void; wettability; Aging; Assembly; Curing; Failure analysis; Flip chip; Glass; Material properties; Materials reliability; Temperature; Thermal expansion;
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
DOI :
10.1109/ECTC.2000.853171