DocumentCode
2167476
Title
Studies on a reflowable underfill for flip chip application
Author
Wang, Tie ; Lum, Colin ; Kee, Joanne ; Chew, T.H. ; Miao, Ping ; Foo, Louis ; Lin, Charles
Author_Institution
Questech Solution Pte Ltd., Singapore
fYear
2000
fDate
2000
Firstpage
323
Lastpage
329
Abstract
This paper presents the material properties, assembly process identification and reliability performance coupled with failure analysis of a newly developed reflowable underfill. The curing profile, glass transition temperature (Tg), coefficient of thermal expansion (CTE) and modules were investigated via differential scanning calorimeter (DSC), thermo-mechanical analyzer (TMA) and dynamic mechanical analyzer (DMA), respectively. The dependence of viscosity on aging time was measured via Brookfield viscometer. Wettability was demonstrated through solder sphere wetting test. In addition, the effect of reflow profile on wettability was evaluated as well, for example, the variation of overall acid number under several reflow profiles was monitored via titration with standard sodium hydroxide (NaOH) solution. After that, approaches to control voids were made by manipulating material aging time and adjusting reflow profile, and the effects were subsequently identified via scanning acoustic microscopy (C-SAM)
Keywords
encapsulation; flip-chip devices; Brookfield viscometry; acid number; aging; coefficient of thermal expansion; curing profile; differential scanning calorimetry; dynamic mechanical analysis; elastic modulus; failure analysis; flip-chip packaging; glass transition temperature; reflowable underfill material; reliability; scanning acoustic microscopy; solder sphere wetting test; thermomechanical analysis; titration; viscosity; void; wettability; Aging; Assembly; Curing; Failure analysis; Flip chip; Glass; Material properties; Materials reliability; Temperature; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-5908-9
Type
conf
DOI
10.1109/ECTC.2000.853171
Filename
853171
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