Force microscopy using backscattered light

Author

Volpe, Giovanni ; Kozyreff, Gregory ; Petrov, Dmitri

Author_Institution

lCFO-Inst. de Ciencies Fotoniques, Castelldefels

fYear

2007

fDate

17-22 June 2007

Firstpage

1

Lastpage

1

Abstract

An optically trapped particle works as an extremely sensitive probe for the measurement of pico-and femto-Newton forces in microscopic systems (photonic force microscopy, PFM). It comprises an optical trap to hold the probe particle and a position sensing system. The backscattered light field projected on a quadrant photon detector (QPD) or a position sensitive detector (PSD) to monitor the position of the particle.

Keywords

backscatter; force measurement; light scattering; optical microscopy; quantum optics; radiation pressure; PSD; QPD; backscattered light; backscattered light field projection; femto-Newton forces; force microscopy; microscopic systems; optical trapping; photonic force microscopy; pico-Newton forces; position sensitive detector; quadrant photon detector; Charge carrier processes; Force measurement; Monitoring; Optical microscopy; Optical sensors; Particle measurements; Position sensitive particle detectors; Probes; Ultrafast optics; Ultraviolet sources;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-0931-0

Electronic_ISBN

978-1-4244-0931-0

Type

conf

DOI

10.1109/CLEOE-IQEC.2007.4386656

Filename

4386656