DocumentCode :
2167728
Title :
AlGaN/GaN HEMT Large Signal Nonlinear Compact Model Accounting for Thermal Effects and Trapping Dispersion
Author :
Yueying Liu ; Reese, E.
Author_Institution :
TriQuint, Richardson, TX, USA
fYear :
2013
fDate :
13-16 Oct. 2013
Firstpage :
1
Lastpage :
5
Abstract :
A customized nonlinear compact model is applied to AlGaN/GaN HEMT devices for Power Amplifier applications. The model formulation is created to represent behavior specific to GaN HEMT devices. The model incorporates novel formulations for Ids equations, bias dependency of access resistances, charge storage, and dispersion models, tailored to GaN HEMT device behavior. The model has been used to generate nonlinear common-source models in frequency ranges of S-, Ku- and Ka-band processes. A typical 4x50um S-band and Ku-band device will be used to demonstrate the extraction and validation of the model, in which the model has predicted the DCIV, CW S Parameters, and LP results accurately.
Keywords :
III-V semiconductors; S-parameters; aluminium compounds; electric resistance; gallium compounds; high electron mobility transistors; microwave transistors; power amplifiers; wide band gap semiconductors; AlGaN-GaN; CW S parameters; DCIV; HEMT device behavior; HEMT large signal nonlinear compact model; Ids equations; Ka-band processes; Ku-band device; LP; S-band; charge storage; customized nonlinear compact model; dispersion models; nonlinear common-source models; power amplifier applications; thermal effects; trapping dispersion; Dispersion; Equations; Gallium nitride; HEMTs; Load modeling; Mathematical model; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2013 IEEE
Conference_Location :
Monterey, CA
Type :
conf
DOI :
10.1109/CSICS.2013.6659214
Filename :
6659214
Link To Document :
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