Title :
Benchmarking of Large-Area GaN-on-Si HFET Power Devices for Highly-Efficient, Fast-Switching Converter Applications
Author :
Reiner, R. ; Waltereit, P. ; Benkhelifa, Fouad ; Muller, Sebastian ; Wespel, M. ; Quay, Ruediger ; Schlechtweg, Michael ; Mikulla, Michael ; Ambacher, Oliver
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg, Germany
Abstract :
This work reports the development and fabrication of large area AlGaN/GaN-on-Si HFETs for the use in highly-efficient fast-switching power converters. High performance is demonstrated by full characterization of static- and dynamic-parameters and a direct comparison to two commercial state-of-the-art silicon power devices. Compared to their silicon counterparts the GaN-device achieves by a factor of 3 lower static area specific on-state resistance RON×A, and by a factor of 3 lower static on-state resistance times gate charge product RON×Q. In switching tests the device achieves a low dynamic dispersion and low switching losses. Furthermore in this work a sophisticated measurement setup for characterization of dynamic parameters is developed and demonstrated. Characterization and test conditions are adapted for the use in fast-switching power converter applications.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; power HEMT; silicon; switching convertors; wide band gap semiconductors; AlGaN-GaN-Si; benchmarking; dynamic dispersion; dynamic parameters; fast-switching power converters; gate charge product; large area AlGaN-GaN-on-Si HFETs; state-of-the-art silicon power devices; static area specific on-state resistance; static on-state resistance; static parameters; switching losses; switching tests; Current measurement; Electrical resistance measurement; Gallium nitride; HEMTs; Logic gates; MODFETs; Resistance;
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2013 IEEE
Conference_Location :
Monterey, CA
DOI :
10.1109/CSICS.2013.6659219