Title :
Electrical performance improvements on RFICs using bump chip carrier packages as compared to standard small outline packages
Author :
Horng, T.S. ; Wu, S.-M. ; Li, J.-Y. ; Chiu, C.T. ; Hung, C.P.
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
The electrical models of Bump Chip Carrier (BCC) packages have been established based on the S-parameter measurement. When compared to the standard Thin Shrink Small Outline Packages (TSSOP), BCCs exhibit much smaller parasitics in the equivalent circuits. In the simulation, the insertion and return losses for an arbitrary pair of package leads connected through an on-die 50-ohm line are calculated against frequency. BCCs also show better loss characteristics than TSSOPs over a wide frequency range. By setting a random variable with Gaussian distribution varied within a certain range for each equivalent circuit element of the packages, the Monte Carlo analysis has been performed to study the package effects on a GaAs Heterojunction Bipolar Transistor (HBT). Again, BCCs cause less decrement of HBT´s unity-gain bandwidth than TSSOPs
Keywords :
Monte Carlo methods; S-parameters; chip scale packaging; equivalent circuits; integrated circuit modelling; GaAs; GaAs heterojunction bipolar transistor; Gaussian distribution; Monte Carlo simulation; RFIC; S-parameters; bump chip carrier package; electrical model; equivalent circuit; insertion loss; parasitics; return loss; thin shrink small outline package; unity-gain bandwidth; Circuit simulation; Electric variables measurement; Equivalent circuits; Frequency; Heterojunction bipolar transistors; Insertion loss; Packaging; Radiofrequency integrated circuits; Scattering parameters; Semiconductor device measurement;
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
DOI :
10.1109/ECTC.2000.853192