Crystalline Structure and Surface Morphology of CdTe Thin Films

Author

Savchuk, V. ; Kotlyarchuk, B. ; Lesyuk, R. ; Musiy, R. ; Oszaldowski, M.

Author_Institution

Inst. for Appl. Problems of Mech. & Math., Lviv

fYear

2007

fDate

17-22 June 2007

Firstpage

1

Lastpage

1

Abstract

In this article, we present main results and problems related to growth of CdTe thin films by pulsed laser deposition (PLD), describe the main structural and morphological properties of grown films and discuss the promising features of the material for designing electronic and optoelectronic devices. The crystal structure of grown samples was measured by x-ray diffraction (XRD), transmission electron diffraction (TEM), the surface morphology and roughness was analyzed by atomic force microscopy (AFM).

Keywords

II-VI semiconductors; X-ray diffraction; atomic force microscopy; cadmium compounds; crystal morphology; pulsed laser deposition; semiconductor thin films; surface morphology; surface roughness; transmission electron microscopy; AFM; CdTe; CdTe thin film growth; TEM; X-ray diffraction; XRD; atomic force microscopy; crystalline structure; pulsed laser deposition; surface morphology; surface roughness; transmission electron diffraction; Atomic force microscopy; Atomic measurements; Crystallization; Force measurement; Pulsed laser deposition; Sputtering; Surface morphology; Thin film devices; Transistors; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-0931-0

Electronic_ISBN

978-1-4244-0931-0

Type

conf

DOI

10.1109/CLEOE-IQEC.2007.4386675

Filename

4386675