DocumentCode :
2168324
Title :
Vertically emitting AlAs/GaAs microcavities with quality factors exceeding 110.000
Author :
Strauss, Michael ; Löffler, A. ; Reitzenstein, S. ; Hofmann, C. ; Kamp, M. ; Höfling, S. ; Forchel, A.
Author_Institution :
Univ. Wurzburg, Wurzburg
fYear :
2007
fDate :
17-22 June 2007
Firstpage :
1
Lastpage :
1
Abstract :
High quality semiconductor microcavities have attracted considerable attention as a compact solid state platform for the investigation of light-matter interaction between photons and excitons in single quantum dots. Owing to a combined optimization of the design (increased number of mirror pairs), the growth conditions (V/III ratio) and the dry etching process we were able to achieve record quality (Q) factors beyond 100.000 for micropillars with diameters of 4 mum and Q factors as high as 29.000 for diameters of 2 mum.
Keywords :
III-V semiconductors; Q-factor; aluminium compounds; excitons; gallium arsenide; microcavities; photoluminescence; semiconductor quantum dots; AlAs-GaAs; compact solid state platform; dry etching; excitons; high quality semiconductor microcavities; light-matter interaction; micropillars; photons; quality factors; single quantum dots; vertically emitting microcavities; Distributed Bragg reflectors; Etching; Gallium arsenide; Microcavities; Mirrors; Plasma confinement; Plasma temperature; Q factor; Quantum dots; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-0931-0
Electronic_ISBN :
978-1-4244-0931-0
Type :
conf
DOI :
10.1109/CLEOE-IQEC.2007.4386686
Filename :
4386686
Link To Document :
بازگشت