DocumentCode :
2168417
Title :
Recent developments in thermal modelling of high-speed dye recording
Author :
Meinders, Erwin R. ; Tieke, Benno
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
fYear :
2002
fDate :
2002
Firstpage :
129
Lastpage :
131
Abstract :
Research in optical data storage is mainly driven by the desire for higher data capacity and higher data transfer rates. To accelerate the research progress on dye recording, a basic understanding of the physical principles is inevitable. Thermal modelling is an important tool, since dye recording is based on thermally induced irreversible transformations in a thin recording layer. In addition, we can use thermal modelling to anticipate future needs, like write strategy and recording stack optimisation. For high-speed recording, several issues such as in-track and cross-track thermal interference may limit the data transfer rate and may impose limitations on higher data capacity formats, such as DVD+R and DVR-R. Recent developments in the thermal modelling of dye recording are discussed in this paper. A method is proposed to ´calibrate´ the thermal model by using measured transition write powers, determined from DC-write recorder measurements, and the corresponding transition temperatures. Additional transition powers were determined from atomic force microscopy (AFM) analyses. Furthermore, we present measurements indicating a temperature-dependent absorption of the recording dye and show first modelling results.
Keywords :
atomic force microscopy; dyes; electronic engineering computing; interference; optical disc storage; optical engineering computing; thermal analysis; write-once storage; AFM; DC-write recorder measurements; DVD+R; DVR-R; atomic force microscopy analyses; data format capacity; data transfer rate; dye recording physical principles; high-speed dye recording thermal modelling tools; in-track/cross-track thermal interference; recording dye temperature-dependent absorption; recording stack optimisation; thermally induced irreversible transformations; thin recording layers; transition temperatures; transition write powers; write strategy; Absorption; Acceleration; Atomic force microscopy; Atomic measurements; Disk recording; High speed optical techniques; Interference; Memory; Optical recording; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Memory and Optical Data Storage Topical Meeting, 2002. International Symposium on
Print_ISBN :
0-7803-7379-0
Type :
conf
DOI :
10.1109/OMODS.2002.1028590
Filename :
1028590
Link To Document :
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