DocumentCode :
21685
Title :
Application of the Feature Selective Validation Method to Pattern Recognition
Author :
Ventosa, Oriol ; Pous, Marc ; Silva, Francisco ; Jauregui, Ricardo
Author_Institution :
Dept. d´Eng. Electron., Univ. Politec. de Catalunya, Barcelona, Spain
Volume :
56
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
808
Lastpage :
816
Abstract :
Pattern recognition is a mature field; however, in recent years it has developed a special interest. Many methods have been developed exclusively focusing on this subject; all of them, however, are centered on certain types of patterns. In this paper, a new method, which aims to be as flexible as possible, is proposed. This technique is based on a validation standard method used in electromagnetic compatibility named feature selective validation. The final objective of developing the algorithm is to make it adaptable to diverse types of patterns. An application on the recognition of transient patterns is exposed as an example. Nevertheless, a wide range of other types of signals is likely to be treated with the same logic.
Keywords :
electromagnetic compatibility; pattern recognition; electromagnetic compatibility; feature selective validation method application; mature field; transient pattern recognition; validation standard method; Correlation; Feature extraction; Interpolation; Pattern recognition; Shape; Transient analysis; Vectors; Computational electromagnetics method; data comparison; feature selective validation (FSV) method; pattern recognition; validation;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2013.2291494
Filename :
6681968
Link To Document :
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