DocumentCode :
2168546
Title :
Impact of quantum mechanical effects on design of nano-scale narrow channel n- and p-type MOSFETs
Author :
Majima, H. ; Saito, Y. ; Hiramoto, T.
Author_Institution :
Inst. of Ind. Sci., Tokyo Univ., Japan
fYear :
2001
fDate :
2-5 Dec. 2001
Abstract :
The impact of quantum mechanical effects and device design guidelines in nano-scale narrow channel n-type and p-type MOSFETs is presented. Ultra-narrow channel MOSFETs with n- and p-type source/drain have been successfully fabricated and threshold voltage increase due to quantum confinement has been clearly observed in both n- and p-type devices. By analytical calculations, device design for threshold voltage adjustment in n- and p-type MOSFETs using quantum mechanical effects is discussed. The calculations also demonstrate that an ultra-narrow channel along the <100> direction has a large advantage in device design over the <110> direction due to higher mobility.
Keywords :
MOSFET; electron mobility; hole mobility; nanotechnology; quantum interference phenomena; semiconductor device measurement; semiconductor device models; silicon-on-insulator; 10 nm; [100] bonded SOI wafer; [100] direction; [110] direction; analytical calculations; device design guidelines; electron mobility; hole mobility; n-type MOSFETs; nano-scale narrow channel MOSFET design; p-type MOSFETs; quantum confinement; quantum mechanical effects; threshold voltage adjustment; threshold voltage increase; Electron beams; Fabrication; Guidelines; Lithography; MOSFETs; Nanoscale devices; Potential well; Quantum mechanics; Silicon; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
Type :
conf
DOI :
10.1109/IEDM.2001.979618
Filename :
979618
Link To Document :
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