Title :
An artificial fingerprint device (AFD) module using poly-Si thin film transistors with logic LSI compatible process for built-in security
Author :
Maeda, S. ; Kuriyama, H. ; Ipposhi, T. ; Maegawa, S. ; Inuishi, M.
Author_Institution :
ULSI Dev. Center, Mitsubishi Electr. Corp., Itami, Japan
Abstract :
An artificial fingerprint device module using polycrystalline silicon thin film transistors with logic LSI compatible process is proposed for securing a digital society. Substituting for actual fingerprint characteristics variation of polysilicon thin film transistors is utilized. The variation is random and offers unique, nonalterable, and nonduplicable numbers. Stable recognition operation based on the nature of polysilicon TFTs is suggested.
Keywords :
CMOS integrated circuits; elemental semiconductors; fingerprint identification; large scale integration; silicon; thin film transistors; Si; artificial fingerprint device; built-in security; characteristics variation; digital society; logic LSI compatible process; nonduplicable numbers; polysilicon thin film transistors; Capacitors; Electrodes; Fingerprint recognition; Fluctuations; Guidelines; Large scale integration; Logic devices; Security; Silicon; Thin film transistors;
Conference_Titel :
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-7050-3
DOI :
10.1109/IEDM.2001.979625
