• DocumentCode
    2168699
  • Title

    Evaluation of cell characteristics by opto-electrostatic micromanipulation

  • Author

    Nishioka, Masateru ; Katsura, Shinji ; Hirano, Ken ; Mizuno, Akira

  • Author_Institution
    Dept. of Ecological Eng., Toyohashi Univ. of Technol., Japan
  • Volume
    2
  • fYear
    1995
  • fDate
    8-12 Oct 1995
  • Firstpage
    1353
  • Abstract
    Characteristics of a single cell of micrometer order can be easily studied using opto-electrostatic micromanipulation (OEMM) techniques. The authors present here the characteristics of Escherichia coli and Schizosaccharomyces pombe cells by trapping them with a YAG laser and rotating them under a high frequency alternating electric field. The intensity of the field was varied from 0.5×105 to 1.6×106 V/m (peak peak) and the frequency was changed from 5 kHz to 2 MHz. Characteristics of the cell rotation depends on frequency and intensity of the electric field. While the living cell has a peak critical rotation frequency (PCRF) at 1 MHz, that of a dead cell depends on the process of killing viz. thermal, chemical, ultraviolet or electric pulse. The measurement of the rotation rate will be utilized for investigating the dielectric properties of the individual cell
  • Keywords
    bioelectric phenomena; biological effects of fields; biological techniques; electric fields; electrostatics; laser beam applications; optical rotation; 1 MHz; 5 kHz to 2 MHz; Escherichia coli; HF AC electric field; Schizosaccharomyces pombe; YAG laser; cell rotation; dielectric properties; opto-electrostatic micromanipulation; peak critical rotation frequency; rotation rate measurement; Biomedical optical imaging; Chemical processes; Dielectric measurements; Dielectrophoresis; Electric variables measurement; Electrodes; Force measurement; Frequency; Optical feedback; Rotation measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-3008-0
  • Type

    conf

  • DOI
    10.1109/IAS.1995.530459
  • Filename
    530459