Title :
A Compact System for Systematic Noise Measurement of Schottky Diodes for THz Applications
Author :
Biber, S. ; Koca, Ö ; Huber, K. ; Rehm, G. ; Schmidt, L.P.
Author_Institution :
Lehrstuhl fÿur Hochfrequenztechnik (LHFT), Universitÿt Erlangen-Nÿurnberg, Cauerstr. 9, D-91058 Erlangen, Germany. phone: +49 9131 8527223, facsimile: +49 9131 8527212, email: stephan@lhft.eei.uni-erlangen.de
Abstract :
As Schottky diodes still remain the most frequently used devices in THz mixers, precise evaluation of their DC and noise performance is essential for the improvement of mixers in the sub-millimeter wave regime. We present first results from a measurement system which is able to measure the DC characteristics and the noise for Schottky diodes as a function of frequency and bias current. The automated system is capable of contacting many diodes consecutively.
Keywords :
Anodes; Circuit noise; Circulators; Current density; Current measurement; Frequency measurement; Nanopositioning; Noise measurement; Schottky diodes; Temperature;
Conference_Titel :
Microwave Conference, 2002. 32nd European
Conference_Location :
Milan, Italy
DOI :
10.1109/EUMA.2002.339218
