Title :
Face recognition uiing trichotomic combination Of SVD, DF-LDA and LPP
Author :
Shylaja, S.S. ; Murthy, J N Balasubramanya ; Natarajan, S. ; Pritha, D.N. ; Savitha, L.
Author_Institution :
Dept. of Inf. Sci. & Eng., P E S Inst. of Technol., India
Abstract :
One of the challenges the face recognition application is facing today is that of the high dimensionality of multivariate data. In this context, this paper proposes to compare the performance of a triumvirate combination of linear dimensionality reduction techniques namely Singular Value Decomposition (SVD) which maximizes the variance of the training vectors, Direct Fractional Linear Discriminant Analysis (DFLDA) that maximizes the ¿between-class¿ scatter while minimizing the ¿within-class¿ scatter and Locality Preserving Projection (LPP) which preserves the local features those unique from its nearest neighbors. The amalgamation containing different ratios is chosen from the features extracted by the three independent techniques mentioned above. Original Face space is projected onto the manifold of chosen basis. The weights obtained from these projections for the probe set are compared with that of the query image using the mean distance classifier. The proposed method has been tested on YALE dataset and the combination in the ratio 3:2:5 showed significant improvement in the efficiency of recognition, with a calculated accuracy of 92.7% on a test set of 165 images.
Keywords :
data reduction; face recognition; DF-LDA; LPP; SVD; direct fractional linear discriminant analysis; face recognition; high dimensionality; linear dimensionality reduction; locality preserving projection; mean distance classifier; multivariate data; query image; singular value decomposition; trichotomic combination; Face recognition; Feature extraction; Image recognition; Linear discriminant analysis; Nearest neighbor searches; Probes; Scattering; Singular value decomposition; Testing; Vectors; Classification; DFLDA; Dimensionality Reduction; LPP; Pattern Recognition; Receiver Operating Characteristics (ROC); SVD;
Conference_Titel :
Computer and Automation Engineering (ICCAE), 2010 The 2nd International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5585-0
Electronic_ISBN :
978-1-4244-5586-7
DOI :
10.1109/ICCAE.2010.5451957