DocumentCode :
2168969
Title :
Flip chip assembly utilizing anisotropic conductive films: a feasibility study
Author :
Delaney, Drew ; White, Jerry
Author_Institution :
Interconnect Syst. Lab., Motorola Semicond. Products Sector, Tempe, AZ, USA
fYear :
2000
fDate :
2000
Firstpage :
641
Lastpage :
645
Abstract :
There is a persistent effort to miniaturize, reduce costs and search for environmentally friendly alternatives in the semiconductor industry. With the many advantages of flip chip assembly technology, it is predicted to be utilized for a larger percentage of all semiconductor packaging in the future. Anisotropic conductive films (which are generally used to assemble die to glass for liquid crystal displays) are now being investigated as a replacement for traditional Pb-Sn solder bump flip chip assembly applications. In this study, the goal was to determine which parameters are critical to develop a robust and reliable assembly process of a die to an organic substrate (FR5). Design of Experiments was used to determine which process parameters were critical in meeting reliability requirements. Reliability testing included -55C to 125C liquid-liquid thermal shock and autoclave (121C 1 atm. Pressure). Additional parts were also assembled and subjected to multiple Sn-Pb and Sn-Ag reflow profiles to study the effect of BGA solder reflow on the ACF film. The results show that Ni bump thickness and bonding pressure are critical parameters (for assembly on organic substrates) in maintaining a robust product through extensive reliability testing. Experiments have shown that anisotropic conductive films may be a viable option as a cost effective, lead free flip chip assembly alternative
Keywords :
design of experiments; flip-chip devices; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; lead alloys; organic compounds; reflow soldering; silver alloys; substrates; tin alloys; -55 to 125 C; -55C to 125C; 1 atm; 121 C; 121C; ACF film; BGA solder reflow; FR5; Ni bump thickness; Si; Sn-Ag; Sn-Ag reflow profiles; Sn-Pb; Sn-Pb reflow profiles; anisotropic conductive films; bonding pressure; costs; environmentally friendly technologies; lead free flip chip assembly; liquid-liquid thermal shock; organic substrate; reliability testing; semiconductor industry; Anisotropic conductive films; Assembly; Costs; Electronics industry; Flip chip; Glass; Robustness; Semiconductor device packaging; Substrates; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853226
Filename :
853226
Link To Document :
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