DocumentCode :
2169017
Title :
Super resolution near field structure with alternative recording materials
Author :
Jooho Kim ; Hwang, Inoh ; Yoon, Duseop ; Park, Insik ; Shin, DongHo ; Kuwahara, Masashi ; Tominaga, Junji
Author_Institution :
Saaeung Electronics Co., Ltd.
fYear :
2002
fDate :
7-11 July 2002
Firstpage :
201
Lastpage :
203
Keywords :
Atomic force microscopy; Disk recording; Magnetic materials; Optical materials; Optical microscopy; Optical recording; Optical surface waves; Scanning electron microscopy; Surface morphology; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Memory and Optical Data Storage Topical Meeting, 2002. International Symposium on
Conference_Location :
Waikoloa, HI, USA
Print_ISBN :
0-7803-7379-0
Type :
conf
DOI :
10.1109/OMODS.2002.1028615
Filename :
1028615
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2169017
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