DocumentCode :
2169192
Title :
MEMS sensor multi-chip module assembly with TAB carrier pressure belt for aircraft flight testing
Author :
Kim, Namsoo P. ; Holland, Mark J. ; Tanielian, Minas H. ; Poff, Ron
Author_Institution :
Inf., Commun., Sensor & Electron. Technol., Boeing Phantom Works, Seattle, WA, USA
fYear :
2000
fDate :
2000
Firstpage :
689
Lastpage :
696
Abstract :
Many different sensor types and their associated electronic systems are utilized for aircraft and aerospace applications. When atmospheric data is collected like pressure load surveys for aircraft, arrays of many sensors are required on a common bus. With the support from a device manufacturer, we have been developing a multi-Micro-Electro-Mechanical System (MEMS) sensor based electronic system. We report in this paper a unique electronic packaging configuration incorporating MEMS sensors, multi-chip modules (MCMs) and tape automated bonding (TAB) carrier. Electronic assembly and interconnection methods used for various levels of packaging are also described. They include direct-chip-attachment (flip chip) process for the MEMS device to the module and bus connection through TAB carrier to the host computer. Encapsulation material for electronic components was selected for improving the reliability of the module. Localized circuit functionality was needed to conduct temperature compensation and self-calibration. A thin and/or miniaturized profile was required for aerodynamic reasons. Fully assembled hardware in the form of a pressure belt was installed on airplanes and passed two separate flight tests. Data analyses on these flight test results are also included
Keywords :
aircraft testing; automatic test equipment; calibration; integrated circuit packaging; intelligent sensors; microsensors; multichip modules; pressure sensors; tape automated bonding; Encapsulation material; MEMS sensor; TAB carrier pressure belt; aerodynamic problems; aircraft flight testing; data analyses; direct-chip-attachment process; flight tests; miniaturized profile; multi-Micro-Electro-Mechanical System; multi-chip module assembly; reliability; self-calibration; tape automated bonding carrier; temperature compensation; Aerospace electronics; Aircraft manufacture; Assembly; Circuit testing; Electronics packaging; Manufacturing; Micromechanical devices; Sensor arrays; Sensor systems; Sensor systems and applications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853233
Filename :
853233
Link To Document :
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