Title :
The influence of skewed populations on statistical and neural network control charts for process mean
Author :
Ong, Hong Choon ; Ooi, Yew Jin
Author_Institution :
Sch. of Math. Sci., Univ. Sains Malaysia, Minden, Malaysia
Abstract :
Control charts are important tools for detecting the presence of special cause in the process and are widely used in manufacturing. It is known that neural network control charts can detect smaller shifts in the process mean better than statistical control charts. In this study, the average run length of various control charts are compared using gamma distribution generated data with various skewness to measure the robustness. From the results obtained, the neural network based control chart is found to be less robust compared to the statistical based control charts which includes Shewhart X¿ control chart, EWMA and CUSUM based control charts. Based on our results, we concluded that the EWMA control chart is the most robust.
Keywords :
control charts; gamma distribution; neurocontrollers; statistical process control; CUSUM based control chart; EWMA based control chart; Shewhart X control chart; gamma distribution; neural network control charts; process mean; skewed populations influence; statistical control chart; Artificial neural networks; Control charts; Length measurement; Manufacturing processes; Neural networks; Neurons; Pattern recognition; Process control; Quality control; Robust control; average run length; control chart; neural network; skewed population;
Conference_Titel :
Computer and Automation Engineering (ICCAE), 2010 The 2nd International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-5585-0
Electronic_ISBN :
978-1-4244-5586-7
DOI :
10.1109/ICCAE.2010.5451970
