DocumentCode :
2169456
Title :
On ϵ-biased generators in NC0
Author :
Mossel, Elchanan ; Shpilka, Amir ; Trevisan, Luca
Author_Institution :
U.C. Berkeley, CA, USA
fYear :
2003
fDate :
11-14 Oct. 2003
Firstpage :
136
Lastpage :
145
Abstract :
M. Cryan and P.B. Miltersen (2001) recently considered the question of whether there can be a pseudorandom generator in NC0, that is, a pseudorandom generator that maps n bits strings to m bits strings and such that every bit of the output depends on a constant number k of bits of the seed. They show that for k = 3, if m ≥ 4n + 1, there is a distinguisher; in fact, they show that in this case it is possible to break the generator with a linear test, that is, there is a subset of bits of the output whose XOR has a noticeable bias. They leave the question open for k ≥ 4. In fact they ask whether every NC0 generator can be broken by a statistical test that simply XORs some bits of the input. Equivalently, is it the case that no NC0 generator can sample an ε-biased space with negligible ε? We give a generator for k = 5 that maps n bits into cn bits, so that every bit of the output depends on 5 bits of the seed, and the XOR of every subset of the bits of the output has bias 2-Ω(nc4)/. For large values of k, we construct generators that map n bits to nΩ(√k) bits and such that every XOR of outputs has bias 2-n1(2√k)/. We also present a polynomial-time distinguisher for k = 4, m ≥ 24n having constant distinguishing probability. For large values of k we show that a linear distinguisher with a constant distinguishing probability exists once m ≥ Ω(2kn[k2]/). Finally, we consider a variant of the problem where each of the output bits is a degree k polynomial in the inputs. We show there exists a degree k = 2 pseudorandom generator for which the XOR of every subset of the outputs has bias 2-Ω(n) and which map n bits to Ω(n2) bits.
Keywords :
computational complexity; random number generation; ϵ-biased generator; ϵ-biased space; NC0; XOR; distinguishing probability; linear distinguisher; linear testing; polynomial time; pseudorandom generator; Circuits; Computer science; Contracts; National security; Polynomials; Random variables; Research and development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Foundations of Computer Science, 2003. Proceedings. 44th Annual IEEE Symposium on
ISSN :
0272-5428
Print_ISBN :
0-7695-2040-5
Type :
conf
DOI :
10.1109/SFCS.2003.1238188
Filename :
1238188
Link To Document :
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