Title :
Signal, cross talk and signal to noise ratio in bit-wise volumetric optical data storage
Author :
Zhang, Yan ; Milster, Tom D. ; Butz, John ; Bletcher, Warren ; Erwin, Kevin J. ; Walker, Ed
Author_Institution :
Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA
Abstract :
Bit-wise three-dimensional data storage techniques are attractive candidates to increase capacity. Two major bit-wise volumetric data storage techniques have been proposed. The first one is based on a two-photon fluorescent material. The second one is based on materials that change their refractive index. Simulations based on 3D optical transfer functions are described that predict the signal, cross talk and signal to noise ratio of different bit-wise volumetric read out systems. Experimental results based on a fluorescent material are presented.
Keywords :
electronic engineering computing; fluorescence; optical crosstalk; optical disc storage; optical engineering computing; optical noise; optical signal detection; optical testing; optical transfer function; refractive index; two-photon processes; 3D optical transfer function simulations; bit-wise 3D data storage techniques; bit-wise volumetric read out systems; optical disk storage; refractive index change materials; signal/crosstalk/signal to noise ratio; storage capacity; two-photon fluorescent materials; volumetric bit-wise optical data storage; Fluorescence; Memory; Optical materials; Optical noise; Optical refraction; Optical variables control; Predictive models; Refractive index; Signal to noise ratio; Transfer functions;
Conference_Titel :
Optical Memory and Optical Data Storage Topical Meeting, 2002. International Symposium on
Print_ISBN :
0-7803-7379-0
DOI :
10.1109/OMODS.2002.1028630
