• DocumentCode
    2169910
  • Title

    Investigation of high reliability micro bump plating technique on tape carrier

  • Author

    Chinda, Akira ; Matsuura, Akim ; Yoshioka, Osamu ; Mita, Mamoru

  • Author_Institution
    Systems Mater. Lab., Hitachi Cable Ltd., Ibaraki, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    850
  • Lastpage
    854
  • Abstract
    This paper describes the continuous copper bump plating technique for TAB tape carriers. We investigated the copper plating bath, pre-treatment agents and the bath agitation method. For high speed and uniform plating, the selection of an appropriate copper plating bath is most important. Through our investigations, we found the most suitable bath for copper plating bumps, which obtained good appearance and high reliability bumps at 20 A/dm2 or more. The tape carriers with copper plating bumps were applied to the new stacking board and the burn-in socket substrate for a 0.5 mm pitch BGA package. In both cases, it was confirmed that the tape with bumps had high reliability. Then, a continuous reel to reel plating machine for TAB tape carrier was designed and manufactured
  • Keywords
    ball grid arrays; copper; electroplating; tape automated bonding; 0.5 mm; BGA package; Cu; TAB tape carrier; bath agitation; burn-in socket substrate; copper micro bump plating; plating bath; pre-treatment agent; reel-to-reel plating machine; reliability; stacking board; Copper; Flexible printed circuits; Laboratories; Materials reliability; Packaging machines; Polyimides; Sockets; Substrates; Testing; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    0-7803-5908-9
  • Type

    conf

  • DOI
    10.1109/ECTC.2000.853261
  • Filename
    853261