DocumentCode :
2169910
Title :
Investigation of high reliability micro bump plating technique on tape carrier
Author :
Chinda, Akira ; Matsuura, Akim ; Yoshioka, Osamu ; Mita, Mamoru
Author_Institution :
Systems Mater. Lab., Hitachi Cable Ltd., Ibaraki, Japan
fYear :
2000
fDate :
2000
Firstpage :
850
Lastpage :
854
Abstract :
This paper describes the continuous copper bump plating technique for TAB tape carriers. We investigated the copper plating bath, pre-treatment agents and the bath agitation method. For high speed and uniform plating, the selection of an appropriate copper plating bath is most important. Through our investigations, we found the most suitable bath for copper plating bumps, which obtained good appearance and high reliability bumps at 20 A/dm2 or more. The tape carriers with copper plating bumps were applied to the new stacking board and the burn-in socket substrate for a 0.5 mm pitch BGA package. In both cases, it was confirmed that the tape with bumps had high reliability. Then, a continuous reel to reel plating machine for TAB tape carrier was designed and manufactured
Keywords :
ball grid arrays; copper; electroplating; tape automated bonding; 0.5 mm; BGA package; Cu; TAB tape carrier; bath agitation; burn-in socket substrate; copper micro bump plating; plating bath; pre-treatment agent; reel-to-reel plating machine; reliability; stacking board; Copper; Flexible printed circuits; Laboratories; Materials reliability; Packaging machines; Polyimides; Sockets; Substrates; Testing; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5908-9
Type :
conf
DOI :
10.1109/ECTC.2000.853261
Filename :
853261
Link To Document :
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