Title :
Dynamic measurement of critical-path timing
Author :
Drake, Alan J. ; Senger, Robert M. ; Singh, Harmander ; Carpenter, Gary D. ; James, Norman K.
Author_Institution :
IBM Res., Austin, TX
Abstract :
A high bandwidth critical path monitor (1 sample/ cycle at 4-5 GHz) capable of providing real-time timing margin information to a variable voltage/frequency scaling control loop is described. The critical path monitor tracks the critical path delay to within 1 FO2 inverter delay with a standard deviation less than 3 FO2 delays over process, voltage, temperature, and workload. The CPM is sensitive to 20 mV/bit A/C and 10 mV/bit DC voltage changes, and less than 10degC/bit temperature changes.
Keywords :
delays; invertors; microwave circuits; timing circuits; voltage-frequency convertors; FO2 inverter delay; critical path monitor; critical-path timing; dynamic measurement; frequency 4 GHz to 5 GHz; real-time timing margin information; variable voltage-frequency scaling control loop; Calibration; Clocks; Control systems; Delay; Monitoring; Signal generators; Synchronization; Temperature sensors; Timing; Voltage; Calibration; Critical Path Monitor; DVFS;
Conference_Titel :
Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1810-7
Electronic_ISBN :
978-1-4244-1811-4
DOI :
10.1109/ICICDT.2008.4567288
