Title :
New state variable device opportunities for beyond CMOS: A system perspective
Author :
Zhirnov, Victor V. ; Cavin, Ralph K. ; Bourianoff, George I.
Author_Institution :
Semicond. Res. Corp., Durham, NC
Abstract :
As semiconductor technology moves closer to the ultimate physical limits for scaling of devices that utilize electrons as information bearing particles, many new opportunities for research in the physical sciences are emerging. If we look beyond the limits of scaling electron devices, many more challenging research opportunities exist in the areas of physics of information carriers and physics of communication. A trend, synergistic with scaling, is the use of semiconductor technologies for diverse integrated systems applications. Decreasing physical size of the system may increase both system capability and application space. Therefore, in parallel with device scaling trends and limits, in the second part of this talk we consider system scaling.
Keywords :
CMOS integrated circuits; scaling circuits; semiconductor device testing; CMOS intagreted circuit; diverse integrated systems; electron devices; scaling; semiconductor technology; state variable device; system perspective; CMOS technology; Communication switching; Electron devices; FETs; Information processing; Physics; Space technology; Switches; Throughput; Tunneling; binary switch; communication; state variable; system complexity; system scaling;
Conference_Titel :
Integrated Circuit Design and Technology and Tutorial, 2008. ICICDT 2008. IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-1810-7
Electronic_ISBN :
978-1-4244-1811-4
DOI :
10.1109/ICICDT.2008.4567291