DocumentCode :
2170202
Title :
Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing
Author :
Liang, Chun-Yong ; Wu, Meng-Fan ; Huang, Jiun-Lang
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
1-4 Dec. 2010
Firstpage :
361
Lastpage :
366
Abstract :
This work proposes a power supply noise reduction technique for at-speed testing in the broadcast-based test compression environment. The core technology is the X-slice creation technique, it comprises the scan-chain skew-insertion hardware and the skew configuration generation algorithm. With the created X-slices, the efficiency of X-slice filling to lower the launch cycle switching activity is improved. Effectiveness of the proposed technique is validated with ISCAS89 and ITC99 benchmark circuits.
Keywords :
automatic test pattern generation; circuit testing; design for testability; power supply circuits; at-speed scan testing; broadcast-based compression environment; power supply noise reduction; test compression environment; Circuit faults; Hardware; Noise; Noise reduction; Power supplies; Registers; Testing; at-speed testing; broadcast; power supply noise; test compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2010 19th IEEE Asian
Conference_Location :
Shanghai
ISSN :
1081-7735
Print_ISBN :
978-1-4244-8841-4
Type :
conf
DOI :
10.1109/ATS.2010.68
Filename :
5692273
Link To Document :
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