Title :
A novel technique to measure frequency dependence of surface resistance of YBCO films using some modes in a sapphire rod resonator
Author :
Hashimoto, Toru ; Kobayashi, Yoshio
Author_Institution :
Dept. of Electrical and Electronic System, Saitama University, Saitama 338-8570, Japan. Phone: +81-48-858-3477, Fax: +81-48-857-2529, E-mail: toru@reso.ees.saitama-u.ac.jp
Abstract :
A novel measurement method using four TE0mp modes in a sapphire rod resonator is proposed to measure the frequency dependence of surface resistance Rs of high temperature superconducting (HTS) films. At first, loss tangent tan¿ of the rod and Rs of the films are measured using the TE021 and TE012 modes by a one-dielectric resonator method. Then, the Rs values at two different resonant frequencies for the TE011 and TE022 modes are evaluated by using a well-known relation of tan¿/f=constant for sapphire. As a result, the frequency dependences of Rs of YBCO films at 12, 20 and 25 GHz can be evaluated successfully by using only one sapphire rod.
Keywords :
Electrical resistance measurement; Frequency dependence; Frequency measurement; High temperature superconductors; Loss measurement; Resonant frequency; Superconducting films; Surface resistance; Temperature dependence; Yttrium barium copper oxide;
Conference_Titel :
Microwave Conference, 2002. 32nd European
Conference_Location :
Milan, Italy
DOI :
10.1109/EUMA.2002.339277
