• DocumentCode
    2170542
  • Title

    Mining Complex Boolean Expressions for Sequential Equivalence Checking

  • Author

    Goel, Neha ; Hsiao, Michael S. ; Ramakrishnan, N. ; Zaki, Mohammed J

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
  • fYear
    2010
  • fDate
    1-4 Dec. 2010
  • Firstpage
    442
  • Lastpage
    447
  • Abstract
    We propose a novel technique to mine powerful and generalized boolean relations among flip-flops in a sequential circuit for sequential equivalence checking. In contrast to traditional learning methods, our mining algorithm can detect inductive invariants as well as illegal state cubes. These invariants can be arbitrary boolean expressions and can thus prune a large don´t care space during equivalence checking. Experimental results demonstrate that these general invariants can be very effective for sequential equivalence checking of circuits with no or very few equivalent signals between them, with low computational costs.
  • Keywords
    Boolean functions; flip-flops; sequential circuits; flip-flops; mining complex Boolean expressions; sequential circuit; sequential equivalence checking; Benchmark testing; Data mining; Databases; Frequency modulation; Generators; Logic gates; Optimization; BLOSOM; Induction based proof; Re-descriptions; Sequential Equivalence Checking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2010 19th IEEE Asian
  • Conference_Location
    Shanghai
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4244-8841-4
  • Type

    conf

  • DOI
    10.1109/ATS.2010.81
  • Filename
    5692286