Title : 
Algorithms for fast, memory efficient switch-level fault simulation
         
        
            Author : 
Vandris, E. ; Sobelman, G.
         
        
            Author_Institution : 
University of Minnesota
         
        
        
        
        
        
            Keywords : 
Circuit faults; Circuit simulation; Computational modeling; Discrete event simulation; MOSFETs; Manufacturing; Permission; Sequential circuits; Switching circuits; Wire;
         
        
        
        
            Conference_Titel : 
Design Automation Conference, 1991. 28th ACM/IEEE
         
        
            Conference_Location : 
IEEE
         
        
            Print_ISBN : 
0-89791-395-7