• DocumentCode
    2170580
  • Title

    On-the-Fly Reduction of Stimuli for Functional Verification

  • Author

    Guo, Qi ; Chen, Tianshi ; Shen, Haihua ; Chen, Yunji ; Hu, Weiwu

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    1-4 Dec. 2010
  • Firstpage
    448
  • Lastpage
    454
  • Abstract
    As a primary method for functional verification of microprocessors, simulation-based verification has received extensive studies over the last decade. Most investigations have been dedicated to the generation of stimuli (test cases), while relatively few has focused on explicitly reducing the redundant stimuli among the generated ones. In this paper, we propose an on-the-fly approach for reducing the stimuli redundancy based on machine learning techniques, which can learn from new knowledge in every cycle of simulation-based verification. Our approach can be easily embedded in traditional framework of simulation-based functional verification, and the experiments on an industrial microprocessor have validated that the approach is effective and efficient.
  • Keywords
    learning (artificial intelligence); microprocessor chips; functional verification; machine learning techniques; microprocessors; on-the-fly reduction; Analytical models; Computational efficiency; Computational modeling; Kernel; Microprocessors; Redundancy; Support vector machines; Functional Verification; Godson-2; Online Learning; Redundancy; Stimuli Reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2010 19th IEEE Asian
  • Conference_Location
    Shanghai
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4244-8841-4
  • Type

    conf

  • DOI
    10.1109/ATS.2010.82
  • Filename
    5692287