DocumentCode
2170580
Title
On-the-Fly Reduction of Stimuli for Functional Verification
Author
Guo, Qi ; Chen, Tianshi ; Shen, Haihua ; Chen, Yunji ; Hu, Weiwu
Author_Institution
Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
fYear
2010
fDate
1-4 Dec. 2010
Firstpage
448
Lastpage
454
Abstract
As a primary method for functional verification of microprocessors, simulation-based verification has received extensive studies over the last decade. Most investigations have been dedicated to the generation of stimuli (test cases), while relatively few has focused on explicitly reducing the redundant stimuli among the generated ones. In this paper, we propose an on-the-fly approach for reducing the stimuli redundancy based on machine learning techniques, which can learn from new knowledge in every cycle of simulation-based verification. Our approach can be easily embedded in traditional framework of simulation-based functional verification, and the experiments on an industrial microprocessor have validated that the approach is effective and efficient.
Keywords
learning (artificial intelligence); microprocessor chips; functional verification; machine learning techniques; microprocessors; on-the-fly reduction; Analytical models; Computational efficiency; Computational modeling; Kernel; Microprocessors; Redundancy; Support vector machines; Functional Verification; Godson-2; Online Learning; Redundancy; Stimuli Reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2010 19th IEEE Asian
Conference_Location
Shanghai
ISSN
1081-7735
Print_ISBN
978-1-4244-8841-4
Type
conf
DOI
10.1109/ATS.2010.82
Filename
5692287
Link To Document