DocumentCode :
2170585
Title :
An interconnect transient coupling induced noise susceptibility for dynamic circuits in deep submicron CMOS technology
Author :
Lee, Mankoo ; Darley, Merrick H.
Author_Institution :
Digital Compression Products, Texas Instrum. Inc., Dallas, TX, USA
Volume :
2
fYear :
1998
fDate :
31 May-3 Jun 1998
Firstpage :
256
Abstract :
This paper investigates the susceptibility of Dynamic Logic (DL) noises which are induced during interconnect coupling signal disturbances. We describe transient current/voltage coupling behaviors for a DL noise analysis in terms of far-end crosstalk peak voltage (ΔVcr) and DL´s weak node noise voltage dip (ΔV dn) as a function of pull down transistor threshold voltage (Vt) and signal input slew rate (S). The worst case interconnect arrays are modeled with accurate parasitic RLC elements extracted by 3D field solver and are connected to either high Vt and/or low Vt pull down transistor for DL´s noise margin simulations. We fully investigate the impacts of driving signal´s pull up/down transistor strength, duty cycle, and different operating conditions on transient crosstalk waveforms
Keywords :
CMOS digital integrated circuits; CMOS logic circuits; VLSI; crosstalk; integrated circuit interconnections; integrated circuit noise; transient analysis; deep submicron CMOS technology; duty cycle; dynamic circuits; dynamic logic noises; far-end crosstalk peak voltage; interconnect coupling signal disturbances; interconnect transient coupling induced noise; noise analysis; noise susceptibility; parasitic RLC elements; pull down transistor threshold voltage; signal input slew rate; transient crosstalk waveforms; transient current/voltage coupling behavior; weak node noise voltage dip; worst case interconnect arrays; CMOS logic circuits; CMOS technology; Circuit noise; Coupling circuits; Crosstalk; Integrated circuit interconnections; LAN interconnection; MOSFETs; RLC circuits; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
Type :
conf
DOI :
10.1109/ISCAS.1998.706890
Filename :
706890
Link To Document :
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