DocumentCode :
2170637
Title :
Author index
fYear :
2010
fDate :
1-4 Dec. 2010
Firstpage :
461
Lastpage :
463
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2010 19th IEEE Asian
Conference_Location :
Shanghai
ISSN :
1081-7735
Print_ISBN :
978-1-4244-8841-4
Type :
conf
DOI :
10.1109/ATS.2010.86
Filename :
5692289
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2170637
