DocumentCode :
2171095
Title :
On-Chip Copper-Based vs. Optical Interconnects: Delay Uncertainty, Latency, Power, and Bandwidth Density Comparative Predictions
Author :
Chen, Guoqing ; Chen, Hui ; Haurylau, Mikhail ; Nelson, Nicholas A. ; Albonesi, David H. ; Fauchet, Philippe M. ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng.,, Rochester Univ., NY
fYear :
2006
fDate :
5-7 June 2006
Firstpage :
39
Lastpage :
41
Abstract :
As CMOS technology is scaled, it has become increasingly difficult for conventional copper interconnect to satisfy different design requirements. On-chip optical interconnect has been considered as a potential substitute for electrical interconnect. In this paper, predictions of the performance of CMOS compatible optical devices are made based on current state-of-art optical technologies. Based on these predictions, electrical and optical interconnects are compared for delay uncertainty, latency, power, and bandwidth density
Keywords :
CMOS integrated circuits; integrated circuit interconnections; integrated optoelectronics; optical interconnections; CMOS technology; bandwidth density; delay uncertainty; optical devices; optical interconnect; optical technology; Bandwidth; CMOS technology; Copper; Delay; Optical devices; Optical interconnections; Optical receivers; Optical transmitters; Uncertainty; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interconnect Technology Conference, 2006 International
Conference_Location :
Burlingame, CA
Print_ISBN :
1-4244-0104-6
Type :
conf
DOI :
10.1109/IITC.2006.1648640
Filename :
1648640
Link To Document :
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