Title :
Benchmarks for layout synthesis - evolution and current status
Author_Institution :
MCNC Center for Microelectronics
Keywords :
Algorithm design and analysis; Benchmark testing; Circuit synthesis; Circuit testing; Compaction; Logic testing; Microelectronics; Permission; Routing; Sequential circuits;
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7