DocumentCode :
2171384
Title :
ATPG based on a novel grid-addressable latch element
Author :
Chandra, Susheel J. ; Ferry, Tom ; Gheewala, Tushar ; Pierce, Kerry
Author_Institution :
CrossCheck Technology Inc.
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
282
Lastpage :
286
Keywords :
Application specific integrated circuits; Automatic test pattern generation; Circuit testing; Controllability; Integrated circuit testing; Latches; Observability; Permission; Probes; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979729
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2171384
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