• DocumentCode
    2171500
  • Title

    Automated weld defect classification from ultrasonic signals using statistical moments on normal distribution curves of wavelet co-efficient

  • Author

    Sudheera, K. ; Nandhitha, N.M. ; Nanekar, Parithosh ; Venkatraman, B. ; Rani, B. Sheela

  • Author_Institution
    Dept. of Electron. & Control, Sathyabama Univ., Chennai, India
  • fYear
    2013
  • fDate
    21-23 Sept. 2013
  • Firstpage
    24
  • Lastpage
    28
  • Abstract
    Ultrasonic Testing is a highly reliable Non-Destructive Testing Technique for weld defect characterization. Defects occur either high frequency components (Porosity, Sidewall crack) or as low frequency components (Root, Lack of Fusion, Lack of penetration, slag) in the UT signal. Manual interpretation of these signals is subjective in nature and is dependent on the expertise of the individual. Hence it is necessary to develop automated signal analysis system that classifies the defect. As defect classification is non-linear in nature, neural network based classification techniques are cited in literature. However neural network based techniques are computationally complex and has prediction error. Hence in this paper, an effective range based classification system using statistical moments is proposed. Performance of the proposed technique is measured in terms sensitivity and specificity.
  • Keywords
    mechanical engineering computing; neural nets; normal distribution; porosity; sensitivity; signal classification; slag; ultrasonic materials testing; wavelet transforms; welds; automated signal analysis system; automated weld defect classification; high frequency components; lack-of-fusion; lack-of-penetration; neural network based classification techniques; nondestructive testing technique; normal distribution curves; porosity; prediction error; root; sensitivity; sidewall crack; slag; statistical moments; ultrasonic signals; ultrasonic testing; wavelet coefficient; weld defect characterization; Ultrasonic Testing; normal distribution; sensitivity; statistical moments; wavelets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Electronic Systems (ICAES), 2013 International Conference on
  • Conference_Location
    Pilani
  • Print_ISBN
    978-1-4799-1439-5
  • Type

    conf

  • DOI
    10.1109/ICAES.2013.6659354
  • Filename
    6659354