DocumentCode
2171601
Title
Generation of correlated random patterns for the complete testing of synthesized multi-level circuits
Author
Pateras, Stephen ; Rajski, Janusz
Author_Institution
McGill University
fYear
1991
fDate
21-21 June 1991
Firstpage
347
Lastpage
352
Keywords
Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Coupling circuits; Length measurement; Logic testing; Permission; Position measurement; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979740
Link To Document