DocumentCode :
2171601
Title :
Generation of correlated random patterns for the complete testing of synthesized multi-level circuits
Author :
Pateras, Stephen ; Rajski, Janusz
Author_Institution :
McGill University
fYear :
1991
fDate :
21-21 June 1991
Firstpage :
347
Lastpage :
352
Keywords :
Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Coupling circuits; Length measurement; Logic testing; Permission; Position measurement; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location :
IEEE
Print_ISBN :
0-89791-395-7
Type :
conf
Filename :
979740
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2171601
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