DocumentCode
2171630
Title
A transitive closure based algorithm for test generation
Author
Chakradhar, Srimat T. ; Agrawal, Vishwani D.
Author_Institution
AT&T Bell Laboratories
fYear
1991
fDate
21-21 June 1991
Firstpage
353
Lastpage
358
Keywords
Algorithm design and analysis; Circuit faults; Circuit testing; Decision making; Fault diagnosis; National electric code; Permission; Redundancy; Signal processing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979741
Link To Document