• DocumentCode
    2171802
  • Title

    Memphis: Finding and fixing NUMA-related performance problems on multi-core platforms

  • Author

    McCurdy, Collin ; Vetter, Jeffrey

  • Author_Institution
    Future Technol. Group, Oak Ridge Nat. Lab., Oak Ridge, TN, USA
  • fYear
    2010
  • fDate
    28-30 March 2010
  • Firstpage
    87
  • Lastpage
    96
  • Abstract
    Until recently, most high-end scientific applications have been immune to performance problems caused by Non-Uniform Memory Access (NUMA). However, current trends in micro-processor design are pushing NUMA to smaller and smaller scales. This paper examines the current state of NUMA and makes several contributions. First, we summarize the performance problems that NUMA can present for multi-threaded applications and describe methods of addressing them. Second, we demonstrate that NUMA can indeed be a significant problem for scientific applications, showing that it can mean the difference between an application scaling perfectly and failing to scale at all. Third, we describe, in increasing order of usefulness, three methods of using hardware performance counters to aid in finding NUMA-related problems. Finally, we introduce Memphis, a data-centric toolset that uses Instruction Based Sampling to help pinpoint problematic memory accesses, and demonstrate how we used it to improve the performance of several production-level codes - HYCOM, XGC1 and CAM - by 13%, 23% and 24% respectively.
  • Keywords
    multiprocessing programs; performance evaluation; Memphis; NUMA related performance problems; data-centric toolset; hardware performance counters; instruction based sampling; micro-processor design; multi-core platforms; non-uniform memory access; problematic memory accesses; Automatic control; CADCAM; Computer aided manufacturing; Counting circuits; Delay; Hardware; Laboratories; Programming profession; Sampling methods; Sockets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Performance Analysis of Systems & Software (ISPASS), 2010 IEEE International Symposium on
  • Conference_Location
    White Plains, NY
  • Print_ISBN
    978-1-4244-6023-6
  • Electronic_ISBN
    978-1-4244-6024-3
  • Type

    conf

  • DOI
    10.1109/ISPASS.2010.5452060
  • Filename
    5452060