• DocumentCode
    2172022
  • Title

    StatStack: Efficient modeling of LRU caches

  • Author

    Eklov, David ; Hagersten, Erik

  • Author_Institution
    Dept. of Inf. Technol., Uppsala Univ., Uppsala, Sweden
  • fYear
    2010
  • fDate
    28-30 March 2010
  • Firstpage
    55
  • Lastpage
    65
  • Abstract
    Efficient execution on modern architectures requires good data locality, which can be measured by the powerful stack distance abstraction. Based on this abstraction, the miss rate for LRU caches of any size can be predicted. However, measuring stack distance requires the number of unique memory objects to be counted between successive accesses to the same data object, which requires complex and inefficient data collection. This paper presents a new efficient way of estimating the stack distances of an application. Instead of counting the number of unique memory objects touched between successive accesses to the same data, our scheme only requires the number of memory accesses to be counted, a task efficiently handled by existing builtin hardware counters. Furthermore, this information only needs to be captured for a small fraction of the memory accesses. A new efficient off-line algorithm is proposed to estimate the corresponding stack distance based on this sparse information. We evaluate the accuracy of the proposed estimation compared with full stack distance measurements for 28 of the applications in the SPEC CPU2006 benchmark suite. The estimation shows excellent accuracy based on information about only every 10,000th memory access.
  • Keywords
    cache storage; LRU caches; SPEC CPU2006 benchmark suite; data collection; off-line algorithm; stack distance abstraction; stack distance measurements; Application software; Bandwidth; Counting circuits; Delay; Distance measurement; Hardware; Information technology; Instruments; Random access memory; Runtime;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Performance Analysis of Systems & Software (ISPASS), 2010 IEEE International Symposium on
  • Conference_Location
    White Plains, NY
  • Print_ISBN
    978-1-4244-6023-6
  • Electronic_ISBN
    978-1-4244-6024-3
  • Type

    conf

  • DOI
    10.1109/ISPASS.2010.5452069
  • Filename
    5452069