DocumentCode
2172034
Title
A probabilitistic testability measure for delay faults
Author
Wu, Wen Ching ; Lee, Chung Len
Author_Institution
National Chiao Tung Univ.
fYear
1991
fDate
21-21 June 1991
Firstpage
440
Lastpage
445
Keywords
Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Delay; Logic testing; Permission; Robustness; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979756
Link To Document