• DocumentCode
    2172048
  • Title

    Evaluating expert systems by formal metrics

  • Author

    Chen, Zhisong ; Suen, Ching Y.

  • Author_Institution
    Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada
  • fYear
    1993
  • fDate
    14-17 Sep 1993
  • Firstpage
    763
  • Abstract
    Expert systems (ES) have been used as sophisticated tools to solve complex problems in many areas, such as fault diagnosis in telecommunication and reactive power and voltage control in power electronics. But, few adequate quantitative measures of ES exist, this leads to risks in applying ES. In every discipline, measures are essential. ES, too, needs such measures for assessment. We investigate some characteristics of ES, and present and describe several expert system metrics, including our proposed complexity measure (the RC metric), to formally measure these characteristics
  • Keywords
    expert systems; knowledge engineering; software metrics; RC metric; complexity measure; expert system metrics; expert systems evaluation; fault diagnosis; formal metrics; power electronics; reactive power; software metric; telecommunications; voltage control; Electronic switching systems; Expert systems; Fault diagnosis; Machine intelligence; Pattern recognition; Power electronics; Reactive power control; Software measurement; Software metrics; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 1993. Canadian Conference on
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-2416-1
  • Type

    conf

  • DOI
    10.1109/CCECE.1993.332408
  • Filename
    332408