Title :
Evaluating expert systems by formal metrics
Author :
Chen, Zhisong ; Suen, Ching Y.
Author_Institution :
Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada
Abstract :
Expert systems (ES) have been used as sophisticated tools to solve complex problems in many areas, such as fault diagnosis in telecommunication and reactive power and voltage control in power electronics. But, few adequate quantitative measures of ES exist, this leads to risks in applying ES. In every discipline, measures are essential. ES, too, needs such measures for assessment. We investigate some characteristics of ES, and present and describe several expert system metrics, including our proposed complexity measure (the RC metric), to formally measure these characteristics
Keywords :
expert systems; knowledge engineering; software metrics; RC metric; complexity measure; expert system metrics; expert systems evaluation; fault diagnosis; formal metrics; power electronics; reactive power; software metric; telecommunications; voltage control; Electronic switching systems; Expert systems; Fault diagnosis; Machine intelligence; Pattern recognition; Power electronics; Reactive power control; Software measurement; Software metrics; Voltage control;
Conference_Titel :
Electrical and Computer Engineering, 1993. Canadian Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-2416-1
DOI :
10.1109/CCECE.1993.332408
