Title : 
Fast and accurate protocol specific bus modeling using TLM 2.0
         
        
            Author : 
van Moll, H.W.M. ; Corporaal, H. ; Reyes, V. ; Boonen, M.
         
        
            Author_Institution : 
Tech. Univ. Eindhoven, Eindhoven
         
        
        
        
        
        
            Abstract : 
The need to have Transaction Level models early in the design cycle is becoming more and more important to shorten the development times of complex Systems-on-Chip (SoC). These models need to be functional and timing accurate in order to address different design use-cases during the SoC development. However the typical issue with Transaction Level Modeling (TLM) techniques is the accuracy vs. simulation speed trade-off. Models that can run at high simulation speeds are often modeled at abstraction levels that make them unsuitable for use-cases where timing accuracy is required. Similarly, most models that are cycle accurate are inherently too slow (due to clock sensitive processes) to be used in use-cases where high simulation speed is key. This paper introduces a new methodology that enables the creation of fast and cycle accurate protocol specific bus-based communication models, based on the new TLM 2.0 standard from the Open SystemC Initiative (OSCI).
         
        
            Keywords : 
integrated circuit modelling; logic simulation; system buses; system-on-chip; Open SystemC Initiative; SoC design; TLM 2.0 standard; communication model; protocol specific bus modeling; systems-on-chip; transaction level model; Accuracy; Clocks; Communication standards; Electronic design automation and methodology; Payloads; Pipeline processing; Protocols; Time to market; Timing; Virtual prototyping;
         
        
        
        
            Conference_Titel : 
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
         
        
            Conference_Location : 
Nice
         
        
        
            Print_ISBN : 
978-1-4244-3781-8
         
        
        
            DOI : 
10.1109/DATE.2009.5090680