• DocumentCode
    2172239
  • Title

    Analysis of velocimetry data based on continuous wavelet transform: Application to shock wave physics experiments

  • Author

    Sur, Arijit ; Rav, Amit S. ; Pandey, G.K. ; Joshi, K.D. ; Gupta, S.C.

  • Author_Institution
    Appl. Phys. Div., Bhabha Atomic Res. Centre, Mumbai, India
  • fYear
    2013
  • fDate
    21-23 Sept. 2013
  • Firstpage
    147
  • Lastpage
    151
  • Abstract
    Interferometry is well established technique for measuring particle velocity in shock wave physics experiments, where velocity information is encoded as the phase of a periodically varying intensity pattern. Conventional phase stepping technique by using a pair of quadrature signals cannot resolve rapid velocity changes and sub-fringe phenomena accurately in most of the velocimetry data. In this report a practical analysis method based on the Continuous Wavelet Transform (CWT) is presented to overcome these difficulties. CWT uses an adaptive time window to estimate the instantaneous frequency of signals. We begin by reviewing the CWT and the time-frequency localization properties of wavelets. The instantaneous frequencies of signal are accurately determined by finding the ridge in the scalogram of the CWT and then are converted to target velocity according to Doppler effects. A performance comparison between the CWT and phase stepping technique is demonstrated by a plate impact experimental data of Al-2024T4 material. Results illustrate that new method is superior in terms of accuracy and analysis simplicity.
  • Keywords
    light interferometry; shock waves; velocity measurement; wavelet transforms; Al-2024T4 material; Doppler effects; adaptive time window; continuous wavelet transform; interferometry; particle velocity; phase stepping technique; quadrature signals; shock wave physics experiments; subfringe phenomena; time-frequency localization properties; velocimetry data; Three-dimensional displays; CWT; Hydrodynamic Simulation; Phase Stepping; Phase Unwrapping; Scalogram; VISAR; Wavelet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Electronic Systems (ICAES), 2013 International Conference on
  • Conference_Location
    Pilani
  • Print_ISBN
    978-1-4799-1439-5
  • Type

    conf

  • DOI
    10.1109/ICAES.2013.6659380
  • Filename
    6659380