DocumentCode
2172308
Title
Optimal ordering of analog integrated circuit tests to minimize test time
Author
Huss, Scott D. ; Gyurcsik, Ronald S.
Author_Institution
North Carolina State University
fYear
1991
fDate
21-21 June 1991
Firstpage
494
Lastpage
499
Keywords
Analog integrated circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Performance evaluation; Permission; Probability; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1991. 28th ACM/IEEE
Conference_Location
IEEE
Print_ISBN
0-89791-395-7
Type
conf
Filename
979765
Link To Document