DocumentCode :
2172623
Title :
ORION 2.0: A fast and accurate NoC power and area model for early-stage design space exploration
Author :
Kahng, Andrew B. ; Li, Bin ; Peh, Li-Shiuan ; Samadi, Kambiz
fYear :
2009
fDate :
20-24 April 2009
Firstpage :
423
Lastpage :
428
Abstract :
As industry moves towards many-core chips, networks-on-chip (NoCs) are emerging as the scalable fabric for interconnecting the cores. With power now the first-order design constraint, early-stage estimation of NoC power has become crucially important. ORION was amongst the first NoC power models released, and has since been fairly widely used for early-stage power estimation of NoCs. However, when validated against recent NoC prototypes - the Intel 80-core Teraflops chip and the Intel scalable communications core (SCC) chip - we saw significant deviation that can lead to erroneous NoC design choices. This prompted our development of ORION 2.0, an extensive enhancement of the original ORION models which includes completely new subcomponent power models, area models, as well as improved and updated technology models. Validation against the two Intel chips confirms a substantial improvement in accuracy over the original ORION. A case study with these power models plugged within the COSI-OCC NoC design space exploration tool confirms the need for, and value of, accurate early-stage NoC power estimation. To ensure the longevity of ORION 2.0, we will be releasing it wrapped within a semi-automated flow that automatically updates its models as new technology files become available.
Keywords :
circuit analysis computing; integrated circuit interconnections; logic design; network-on-chip; Intel 80-core Teraflops chip; Intel scalable communications core chip; NoC power models; early-stage power estimation; networks-on-chip; stage design space exploration; Aerospace industry; Bandwidth; Design optimization; Fabrics; Integrated circuit interconnections; Network-on-a-chip; Predictive models; Space exploration; Space technology; Textile industry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location :
Nice
ISSN :
1530-1591
Print_ISBN :
978-1-4244-3781-8
Type :
conf
DOI :
10.1109/DATE.2009.5090700
Filename :
5090700
Link To Document :
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