• DocumentCode
    2173049
  • Title

    Statistical fault injection: Quantified error and confidence

  • Author

    Leveugle, R. ; Calvez, A. ; Maistri, P. ; Vanhauwaert, P.

  • Author_Institution
    Grenoble INP, TIMA Lab., UJF, Grenoble
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    502
  • Lastpage
    506
  • Abstract
    Fault injection has become a very classical method to determine the dependability of an integrated system with respect to soft errors. Due to the huge number of possible error configurations in complex circuits, a random selection of a subset of potential errors is usual in practical experiments. The main limitation of such a selection is the confidence in the outcomes that is never quantified in the articles. This paper proposes an approach to quantify both the error on the presented results and the confidence on the presented interval. The computation of the required number of faults to inject in order to achieve a given confidence and error interval is also discussed. Experimental results are shown and fully support the presented approach.
  • Keywords
    fault diagnosis; integrated circuits; statistical analysis; dependability analysis; integrated circuit; statistical fault injection; Alpha particles; Circuit faults; Electromagnetic interference; Emulation; Indium phosphide; Integrated circuit manufacture; Integrated circuit technology; Laboratories; Neutrons; Sea level; dependability analysis; statistical fault injection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
  • Conference_Location
    Nice
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-3781-8
  • Type

    conf

  • DOI
    10.1109/DATE.2009.5090716
  • Filename
    5090716