DocumentCode
2173049
Title
Statistical fault injection: Quantified error and confidence
Author
Leveugle, R. ; Calvez, A. ; Maistri, P. ; Vanhauwaert, P.
Author_Institution
Grenoble INP, TIMA Lab., UJF, Grenoble
fYear
2009
fDate
20-24 April 2009
Firstpage
502
Lastpage
506
Abstract
Fault injection has become a very classical method to determine the dependability of an integrated system with respect to soft errors. Due to the huge number of possible error configurations in complex circuits, a random selection of a subset of potential errors is usual in practical experiments. The main limitation of such a selection is the confidence in the outcomes that is never quantified in the articles. This paper proposes an approach to quantify both the error on the presented results and the confidence on the presented interval. The computation of the required number of faults to inject in order to achieve a given confidence and error interval is also discussed. Experimental results are shown and fully support the presented approach.
Keywords
fault diagnosis; integrated circuits; statistical analysis; dependability analysis; integrated circuit; statistical fault injection; Alpha particles; Circuit faults; Electromagnetic interference; Emulation; Indium phosphide; Integrated circuit manufacture; Integrated circuit technology; Laboratories; Neutrons; Sea level; dependability analysis; statistical fault injection;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition, 2009. DATE '09.
Conference_Location
Nice
ISSN
1530-1591
Print_ISBN
978-1-4244-3781-8
Type
conf
DOI
10.1109/DATE.2009.5090716
Filename
5090716
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